Speaker: Dr. Oleg Prymak,Department of X-Ray Diffraction, Institut of Inorganic Chemistry and Center for Nanointegration Duisburg-Essen (CeNIDE) Facility for X-ray Diffraction at the University of Duisburg-Essen, Germany
Date: 27.02.2016, Saturday
Time: 10:00 AM
Venue: Seminar Hall, Deptt. of Physics, PU, Chandigarh
Abstract: Among the common techniques used for the investigation of nanostructured materials, X-ray powder diffraction (PXRD) with different geometrical setups is a complementary non-destructive technique for the determination of crystallographic and size-related properties. Here, some examples of PXRD measurements in different applications with the use of Rietveld analysis, including size-specific data obtained from colloid-chemical analysis, transmission and scanning electron microscopy will be presented. Several scientific questions will be addressed, like crystallite size, residual stress and texture, how is it possible to investigate a thin coating of nanomaterials etc. These scientific problems can be solved by the use of X-ray diffractometers available at the Facility for X-ray diffraction of the University of Duisburg-Essen.